Exchange with the Japanese Patent Office From June 8 to 12, 2026, the Spanish Patent and Trademark Office (OEPM) hosted a visit by five patent examiners from the Japanese Patent Office (JPO) as part of the international technical and cooperative exchange program that the agency maintains with the JPO. This visit builds on the exchange programs the OEPM carried out with Japan between 2011 and 2013 and follows up on the invitation extended to examiners last November to visit the JPO. The purpose of this initiative falls within the institutional exchange program of the Department of Patents, Designs, and Technological Information, which facilitates exchanges between examiners from the OEPM and those from other international patent offices, and is part of the project to promote bilateral partnerships under the 2025–2027 Strategic Plan. During the exchange, both offices gave presentations providing relevant information about their respective institutions.
Information was also shared on patent procedures and day-to-day work—including prior art search methods and the application of guidelines—with the aim of promoting the joint use of examination results. The JPO examiners had the opportunity to visit our Historical Archive and learn about the history of industrial property (IP) protection in Spain through its inventions and distinctive signs. In addition, a visit was made to the Spanish National Research Council (CSIC), where they were able to observe the institution’s research activities, as well as its active role in promoting technology transfer, by touring part of its facilities.
The purpose of this patent examiner exchange program is to strengthen trust and deepen mutual understanding among examiners. This trust is fostered in both professional and cultural spheres, thanks to the activities carried out both inside and outside the office.
|
